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UV Lasers

A laser source of ultraviolet light.


Showing results: 16 - 30 of 30 items found.

  • TCSPC Lifetime Kit

    DeltaTime - HORIBA, Ltd.

    The DeltaTime time correlated single photon counting (TCSPC) lifetime plug-in offers acquisition speed, flexibility, and affordability unavailable in any other multifunctioanl fluorescence solution on the market. DeltaTime seamlessly integrates monochromators, polarizers, and other accessories with the widest array of sources (LEDs, laser diodes, supercontinuum lasers) and detectors (including NIR), providing lifetime coverage from 25ps to 1sec over wavelengths spanning the UV to NIR.

  • Spectrometer

    WITec

    All WITec''s Raman microscopes are operated with ultra-high throughput spectrometers (UHTS) that were distinctively developed for high speed and high resolution Raman imaging. The UHTS series comprises of six models in several focal lengths to accommodate multiple laser excitation wavelengths (UV to IR) and spectral resolution requirements.

  • Sensitive Short-wave IR Fluorometer & Absorption Spectrometer

    NS3 NanoSpectralyzer - Applied NanoFluorescence, LLC

    A customizable, modular NanoSpectralyzer: In addition to its core function as a sensitive short-wave IR fluorometer and absorption spectrometer, the NS3 can be configured with any of the following spectral capabilities: Visible emission, extended SWIR emission, UV absorption, visible absorption, extended SWIR absorption, Raman. Up to 5 excitation lasers (405 to 830 nm).

  • Software For SALD-2300 Laser Diffraction Particle Size Analyzer

    LabSolutions SALD - Shimadzu Corp.

    Providing Secure, Confident Data Management on a Network System! The SALD-2300 laser diffraction particle size analyzer is now compatible with data integrity requirements. Connecting LabSolutions SALD to the LabSolutions system, with its proven compatibility with ER/ES regulations, enables confident, reliable data management. In addition to SALD data, consolidated management is available for LC, GC, and UV data.

  • Engineering Services

    Edmund Optics Inc.

    Edmund Optics® (EO) offers a variety of design services in order to meet the specialized needs of our customers. We excel at designing optical and optomechanical systems from components to assemblies and from direct view to imaging to laser optics, spanning from the UV to IR. Our design engineers are well versed in tolerancing and complex optical and mechanical analysis.

  • Photodiodes

    Opto Diode

    Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.

  • Power Probes

    RkT Thermopile Series - Laser Probe Inc.

    The RkT Series thermopile power probes are ideal for measuring Nd:YAG, CO2, and other mid-power lasers. The probes are designed to withstand average power densities up to 20kW/cm2 (15MW/cm2 peak pulse power density). The flat UV to far-IR spectral response allows the probes to measure broadband sources as well. Measure the power of cw sources or the average power of sources pulsed at 5Hz or greater.

  • Spectroradiometers

    SphereOptics GmbH

    Versatile, miniaturised spectroradiometer with the ability to measure both spectral radiance (luminance in cd/m²) and spectral irradiance (illuminance in lux) in one instrumentSpecbos models provide for measurements in the 250-1000 nm range, with specialist versions available for flash photometry and average LED intensity in accordance with CIE 127:2007A built-in red laser pointing device conveniently defines the measurement spot for luminance measurementsThe large variety of accessories and the UV option make this small instrument to a versatile all-rounder to fit a lot of applications

  • Handheld Thermal Imaging Camera

    Model TG 301 - Kusam Electrical Industries Limited

    • One Navigator Key Operation • 16,384 pixels thermal image after interpolation• True D/S 30:1 with precise laser indication. • Bright flashlight with 5 white LEDs• Simple, Smart, Precise and Versatility. • 160x128 pixel 1.77 inches TFT-LCD Display• Alkaline AA size x 3 Batteries• Key chain with wrist strap for carrying convenience• SD Card of 2GB is available.• Compact UV refrigerant leak detector with 5UV/Blue LEDs• Ergonomically designed pistol grip housing with excellent industrial Design

  • Power Meters

    Rk-5700 - Laser Probe Inc.

    The Rk-5700 Series Power Meters accept a wide variety of probes – pyroelectric, silicon, and thermopile – enabling them to perform absolute radiometry, total laser power (cw and average), and irradiance measurements from the UV to far-IR, pW to kW. Integrated lock-in amplifier circuitry allows for synchronous detection of chopped optical signals, improving both S/N ratio and background rejection. The dual channel Rk-5720 simultaneously measures Channel A, Channel B, and the ratio B/A. An IEEE-488 GPIB computer interface, Analog Outputs, Background Cancel, and Autorange are all standard features.

  • Camera Based Beam Propagation Analyzer: M2

    BeamSquared - mks Ophir

    The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.

  • UV & Visible Frequency Mixing Module

    SolsTiS EMM - M Squared Lasers

    The SolsTiS External Mixing Module (SolsTiS EMM) provides fully automated tuning in the visible (480-670 nm) and IR (1.1-4.5 µm) with further extensions options into the UV (300-350 nm). It delivers high stability sum and difference frequency mixing of SolsTiS wavelengths with other single frequency sources, primarily via high efficiency single pass mixing in PPLN. This all-solid state solution for wavelength coverage supersedes dye lasers, removing the hazards and instabilities associated with this toxic gain material. SolsTiS EMM delivers unparalleled performance and reliability, enabling you to automatically tune and scan over a broad wavelength range.

  • M2 & BPP Systems

    Duma Optronics LTD

    The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment.  For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.

  • Packaging Manufacturing

    KLA-Tencor Corp

    KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.

  • *Pulse Characterization Sensors

    mks Ophir

    Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω

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